Abstract
With the tremendous growth in the semiconductor and coatings industries, spectroscopic methods of examining extremely thin films on high refractive index substrates have become increasingly important. One infrared method for analyzing monolayers on substrates such as silicon and gold that has recently gained popularity is 'grazing' or high angle of incidence attenuated total reflection (ATR) spectroscopy. This paper investigates the directional electric field strengths and the extraordinary sensitivity achieved by using the grazing angle ATR method for analyzing monolayers on silicon substrates.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
