Abstract
Abstract Direct measurement of N2 adsorption onto porous Al2O3 films was examined with a quartz crystal microbalance at 77 K. Nitrogen adsorption led to the change in resonant frequency (ΔF) of the Al2O3 coated quartz crystal. A cumulative plot of ΔF at the relative pressure corresponds to the N2 adsorption isotherm, from which pore size distribution and surface area of the Al2O3 thin films (ca. 0.1 mg) were successfully obtained.
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