Abstract

A new type of graphene-based quantum Hall standards is tested for electrical quantum metrology applications at alternating current (ac) and direct current (dc). The devices are functionalized with Cr(CO)3 to control the charge carrier density and have branched Hall contacts based on NbTiN superconducting material. The work is an in-depth study about the characteristic capacitances and related losses in the ac regime of the devices and about their performance during precision resistance measurements at dc and ac.

Highlights

  • W ITH the revision of the International System of Units (SI), quantum effects play a key role in the representation of the units [1], [2]

  • National Metrology Institutes (NMIs) are presently developing a universal electrical quantum standard for the realization of the units ohm, farad, and henry based on the quantum Hall effect (QHE) using graphene devices [3]–[10]

  • We report on a joint effort of the PhysikalischTechnische Bundesanstalt (PTB) and the National Institute of Standards and Technology (NIST) to fabricate and test epitaxial-graphene-based QHE devices for electrical quantum metrology in the dc and ac regime

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Summary

INTRODUCTION

W ITH the revision of the International System of Units (SI), quantum effects play a key role in the representation of the units [1], [2] Following these historical changes, National Metrology Institutes (NMIs) are presently developing a universal electrical quantum standard for the realization of the units ohm, farad, and henry based on the quantum Hall effect (QHE) using graphene devices [3]–[10]. We report on a joint effort of the PhysikalischTechnische Bundesanstalt (PTB) and the National Institute of Standards and Technology (NIST) to fabricate and test epitaxial-graphene-based QHE devices for electrical quantum metrology in the dc and ac regime. The purpose of the new design using fewer Hall contacts and superconducting materials is to optimize and identify the sample characteristics that are critical to the measurement precision, especially in the ac regime [14]

DEVICE CHARACTERISTICS AND TRANSPORT PROPERTIES
DC PRECISION MEASUREMENTS
AC CHARACTERIZATION
AC PRECISION MEASUREMENTS
CONCLUSION

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