Abstract
Thin films of YBa 2Cu 3O 7 and Bi 2Sr 2CaCu 2O 8 were deposited by high-pressure oxygen sputtering and laser ablation, respectively, on bicrystalline substrates of SrTiO 3 with angles of 10,24,36 and 45 degrees. The microstructure of the grain boundary in the substrate and in the film was characterized by transmission electron microscopy. While the grain boundary in the substrate was found to be almost rectilinear with a maximum roughness of about 3 nm, the grain boundaries in the superconducting films exhibited a roughness of up to 200 nm for YBa 2Cu 3O 7 and up to 1 μm for Bi 2Sr 2CaCu 2O 8. The grain boundaries consist of facets, which have a low index habit plane in common with one of the adjacent grains. These facets can be found on a length scale extending from several nanometers up to one micrometer. It is concluded that the exact lateral position of the film grain boundary is not only determined by the substrate but also by the coalescence of growth islands during the film-deposition process. The microstructural results are discussed with respect to their impact on the electrical properties.
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