Grain subdivision and recrystallization in oligocrystalline tantalum during cold swaging and subsequent annealing

Abstract

A coarse-grained ingot of high-purity tantalum was deformed by swaging at room temperature to a strain of 1.28. During annealing at 900°C for 30 min two neighboring grains were observed to behave quite differently. Electron backscattering diffraction (EBSD) results show noticeable differences in terms of the misorientations developed in both grains. The grain developing larger misorientations recrystallized much more readily than the other. The result is interpreted in terms of the differences in grain subdivision into strongly misoriented regions.