Abstract
The effect of the substrate temperatures in a wide range between −150 and 270 °C on the grain size, crystal orientation, Hall mobility, and the carrier concentration of evaporated Te films has been investigated. The grain size and the corresponding Hall mobility were observed to increase remarkably with increasing substrate temperature above 50 °C and with decreasing temperature below 50 °C, contrary to the expectation. The carrier concentration decreased with increasing substrate temperature. The influence of Au nucleation centers on the crystallinity and electronic properties were also investigated. An x−ray diffractometer study indicated c−axis texture to occur with improving grain growth.
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