Abstract
The microstructure of interfaces in WC–Co based cemented carbides with TiC, ZrC, NbC or TaC additions was analysed using energy dispersive X-ray analysis in a transmission electron microscope and using atom probe tomography. Segregation to WC/WC grain boundaries and WC/(M,W)C phase boundaries corresponding to between 0.4 and 1.2 atomic layers of close packed monolayers of Co was observed in all the materials. In addition to Co, Ti, Zr and Nb, but not Ta, segregate to the WC/WC grain boundaries. Segregation was also observed for B, P, Fe and Cr, but not Ni, to the boundaries. These are impurities that originate from the material production. Segregation of Ti, Zr, Nb and Ta to WC/binder phase boundaries was observed. If formation of a MC phase at the interface is assumed, the segregation corresponded to a thickness less than a monolayer.
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