Abstract
Thin liquid layers of polydimethylsiloxane (PDMS) were irradiated by VUV light under nitrogen atmosphere using a Xe(2)- excimer lamp. The irradiated layers were analyzed with infrared reflection absorption spectroscopy (IRRAS) and X-ray photoelectron spectroscopy (XPS), showing a gradual photochemical-induced conversion of the liquid PDMS to solid SiO(2)-like coatings. IRRAS measurements revealed a smooth frequency shift of the maximal absorption band from 1111 to 1231 cm(-1) with increasing irradiation energy density caused by a gradual shift from the asymmetric Si-O stretching vibration of PDMS to the longitudinal optical (LO) mode of SiO(2). The shift was found to be dependent on the applied irradiation energy density and the O/Si ratio in the film analyzed by XPS measurements. The atomic ratio of O/Si increases from 1:1 to about 2.5:1. At the same time, the atomic ratio of C/Si decreases from 2:1 down to 1:6.5. Images taken by high resolution field emission scanning electron microscopy (FESEM) and scanning force microscopy (SFM) show a smooth surface without cracks or pores. The controllable coating properties in combination with the possibility for local irradiation using masks are promising high potential for the coating technology.
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