Abstract
Near-field scanning optical microscopy enables the simultaneous topographical and subdiffraction limited optical imaging of surfaces. A process is presented for the implementation of single individually engineered gold cones at the tips of atomic force microscopy cantilevers. These cantilevers act as novel high-performance optical near-field probes. In the fabrication, thin-film metallization, electron beam induced deposition of etch masks, and Ar ion milling are combined. The cone constitutes a well-defined highly efficient optical antenna with a tip radius on the order of 10 nm and an adjustable plasmon resonance frequency. The sharp tip enables high resolution topographical imaging. By controllably varying the cone size, the resonance frequency can be adapted to the application of choice. Structural properties of these sharp-tipped probes are presented together with topographical images recorded with a cone probe. The antenna functionality is demonstrated by gathering the near-field enhanced Raman signature of individual carbon nanotubes with a gold cone scanning probe.
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