Abstract
The potential of glow discharge optical emission spectroscopy for the analysis of thin films on metals is examined using the example of electrodeposited Ni–P, about 0.53 μm thick. The glow discharge optical emission spectroscopy depth profiles reveal layering of the deposited material with a good correlation between the sequence of layers in the composition profile and that observed by transmission electron microscopy.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
