Abstract
AbstractRendering materials such as metallic paints, scratched metals and rough plastics requires glint integrators that can capture all micro‐specular highlights falling into a pixel footprint, faithfully replicating surface appearance. Specular normal maps can be used to represent a wide range of arbitrary micro‐structures. The use of normal maps comes with important drawbacks though: the appearance is dark overall due to back‐facing normals and importance sampling is suboptimal, especially when the micro‐surface is very rough. We propose a new glint integrator relying on a multiple‐scattering patch‐based BRDF addressing these issues. To do so, our method uses a modified version of microfacet‐based normal mapping [SHHD17] designed for glint rendering, leveraging symmetric microfacets. To model multiple‐scattering, we re‐introduce the lost energy caused by a perfectly specular, single‐scattering formulation instead of using expensive random walks. This reflectance model is the basis of our patch‐based BRDF, enabling robust sampling and artifact‐free rendering with a natural appearance. Additional calculation costs amount to about 40% in the worst cases compared to previous methods [YHMR16, CCM18].
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