Glass formation, optical properties and local atomic arrangement of chalcogenide systems GeTe-Cu and GeTe-In

Abstract

Glass-forming regions of ternary Ge-Te-Cu and Ge-Te-In chalcogenide glasses are examined by differential scanning calorimeter and by X-ray diffraction. Glass transition and crystallization temperatures are about 120 °C To 260 °C, respectively higher than those of binary Ge-Te glass [T. Katsuyama and M. Matsumura, “Infrared Optical Fibres” (Adam Hilger, London, 1989) p. 212]. Only a small range of compositions after quenching the melting alloy is characterized by disordered state, but this range of composition is widened when using a vapor deposition technique. These compositions have two glass transition temperatures, showing the existence of phases in the sample. Both the Kissinger equation and modified Kissinger kinetic analysis were adopted to estimate activation energy and the reaction order of the process. Ge-Te-Cu and Ge-Te-In crystallized in two stages, nucleation and crystal growth. These two processes can be distinguished by exothermal crystallization patterns. An atomic radial distribution analysis has been made on bulk Ge1Te4Inx and Ge1Te4Cux with x = 0.1 by X-ray diffraction techniques. The radial distribution function (RDF) is discussed in terms of the structure factor F(s). Thin films of Ge-Te-Cu and Ge-Te-In are deposited on silicate glass and silicon wafer substrates by vacuum evaporation. The optical energy Eopt are determined from transmission and reflection data of a deposited films. The value of Eopt decreased by increasing metal additive such as Cu or In and discussed as a function of the conditions of their preparation such as substrate type.