Abstract

Induction, tuning, or amplification of chirality in various classes of materials and probing their chiral response are subjects of growing research. Herein, a large chiral signal that is rapidly imprinted in achiral amorphous Ge2Sb2Te5 (GST) thin films measured using synchrotron circular dichroism spectroscopy is reported. The chirality is induced by illuminating the films with pulsed circularly polarized (chiral) laser light for less than 2 μs in total. The effects of laser fluence and film thickness on the chiral response are described. The correlation of the optical results with structural studies by electron diffraction and model simulations suggests that alignment of reamorphized fragments in the crystallized film along the electric field vector of the light forms the centers that are responsible for the observed chirality. These results suggest opportunities for practical applications of this phenomenon and provide avenues for further studies of chirality induction in materials with impact in a wide range of disciplines.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.