Abstract
We study the lateral shifts of reflected light beams in a prism-waveguide system with uniaxially anisotropic metamaterial, and four sufficient conditions for the appearance of large lateral shift are determined. Based on the high sensitivity of the proposed system, we explore the application of the proposed prism-waveguide system in precision processing, including a sample counter used in production line and a planeness detector used in detecting the roughness of dielectric surface.
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