GFAP inflammatory response to dextran-coated silicon electrodes

Abstract

Recent advances in three-dimensional, confocal imaging techniques and image analysis software allow for previously unattainable measurements in the neural environment. Specifically, relative quantitative measurements of the amount of glial fibrillary acidic protein (GFAP) surrounding a neural implant can be determined. In this study, dextran coatings have been applied to silicon neural implants. Dextran coatings have been shown to limit non-specific cell adhesion in vitro. Thus, it is believed that these coatings will limit the amount of gliosis surrounding a neural implant and ultimately improve signal-to-noise ratio. To test this hypothesis, Sprague-Dawley rats were implanted with both dextran-coated and non-dextran-coated silicon electrodes. Using immunohistochemical staining in conjunction with confocal imaging and image analysis techniques, the differences in GFAP upregulation between dextran-coated and non-treated silicon neural implants were investigated.