Getting coincidence information from analysis of sum peaks in singles Ge(Li) spectra test, evaluation and improvement of the method

Abstract

Analysis of sum peaks from singles spectra obtained by a large volume Ge(Li) detector in many cases gives more coincidence information than traditional two-detector gamma-gamma coincidence measurements do. Approximate methods are given to obtain and use coincidence information from sum peaks of a single spectrum. The method gives numbers of coincidence counts several orders of magnitude higher than the traditional two detector methods do, without the use of sophisticated multiparameter analysis equipment and during comparable time. The sum peak analysis method requires much less instrumentation and memory capacity, than the traditional methods, and also multiple coincidences can be measured with rather good efficiency. The possibilities and limitations of the sum peak analysis method are discussed, illustrated by different measurements as examples.