Abstract

AbstractThe total geometrical efficiency, solid angle contribution and gradient were estimated theoretically for a sample placed in a triaxial system equipped with a fluorescent source and x‐ray tube. The contribution of all of the above parameters were assessed at two different secondary target angles with distance. These values are useful for the triaxial system to measure the basic interaction cross‐sections excited by keV photons, to enhance the Compton scattered photons, estimation of monochromacy, solid angle correction and geometrical efficiency. Initially, the secondary target and sample are located at an angle of 45° and detected the scattered radiation from the sample to enhance the Compton scattered photons. By placing the sample at 90° in a triaxial system, the contribution of background is estimated. Comparing the data obtained in the two modes, the Compton photons are enhanced. An analysis of the above parameters and their importance for various potential applications are thoroughly discussed. Copyright © 2004 John Wiley & Sons, Ltd.

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