Abstract
We present a study of electron-beam evaporated ${\text{Pd}}_{0.4}{\text{Ni}}_{0.6}$ alloy thin films by means of ferromagnetic resonance measurements on extended films of varying thickness and anisotropic magnetoresistance measurements of lithographically patterned high aspect-ratio ferromagnetic electrodes, respectively. The results reveal that the direction of the magnetization strongly depends on the electrode lateral dimensions, transitioning from in-plane magnetization for extended films to out-of-the-plane magnetization for electrode widths below 2--3 microns, reaching $\ensuremath{\sim}58\ifmmode^\circ\else\textdegree\fi{}$ off plane for 100 nm-wide nanoelectrodes.
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