Abstract
The Chang’E-2 digital elevation model (DEM, named CE2TMap2015), which is the highest resolution DEM product in China, was released with global coverage of the lunar surface. A detailed geometric quality assessment of the product is desirable for wider applications by users. A novel procedure for evaluating DEM geometric quality, which investigates both the global geometric uncertainty and local gross errors, is proposed in this paper. First, the DEM was divided into regular blocks and matched with the reference DEM. Then, the characteristics of errors were investigated using the statistical information of the matched tie points. Next, the local outlier factor (LOF) algorithm was performed to locate the gross errors. In our experiment, CE2TMap2015 was evaluated using the proposed method, with SLDEM2015 as the reference DEM. The results show that there were widespread geometric inconsistencies with an area-weighted average of 183.1 m horizontally (with the standard deviation being 101.2 m) and 2.3 m vertically (with the standard deviation being 15.4 m). Gross errors were detected automatically and were excluded in the statistical analysis. The periodic errors were extracted in the frequency domain using a Fourier transform. Our research results provide instructional information for the utilization of CE2TMap2015 by world-wide users. The proposed method can be used in the assessment of other planetary DEMs.
Highlights
A digital elevation model (DEM) is a typical topographic mapping product and has a wide range of applications in the field of planetary exploration
Lots of DEMs have been produced based on the data acquired by laser altimeters or cameras onboard the Lunar Reconnaissance Orbiter (LRO), Selenological and Engineering Explorer (SELENE), Chang’E-1 (CE-1), Chang’E-2 (CE-2), and so on [7]
We propose a novel procedure for DEM geometric quality assessment, which can investigate the global characteristics of planimetric and elevation errors and detect local gross errors simultaneously
Summary
A digital elevation model (DEM) is a typical topographic mapping product and has a wide range of applications in the field of planetary exploration. A detailed geometric quality assessment is highly desirable for wider applications by more potential users all over the world Such a method is feasible way to evaluate DEM products of the Earth using high-accuracy ground control points (GCPs) or high-accuracy reference data [13,14]. The Lunar Reconnaissance Orbiter Camera (LROC) Narrow Angle Camera (NAC) DEM, which is constructed through stereo photogrammetry with images of M1303619844 and M1303640934, was chosen as a reference DEM to compare the SLDEM2015 and CE2TMap2015 in the Chang’E-4 (CE-4) landing area. It has a ground sample distance of 5.0 m and height precision of ≈1.1 m.
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