Abstract
A major challenge in the emerging field of low-dose electron microscopy lies in the development of drift correction algorithms against beam-induced specimen motion and compatible with highly noisy transmission electron microscopy (TEM) images. We report here a new drift correction method, namely geometric phase correlation (GPC), to correlate the specimen motion in real space by directly measuring the unwrapped geometric phase shift in the spatial frequency domain of the TEM image (especially from the intensive Bragg spots for crystalline materials) with sub-pixel precision. The GPC method outperforms cross-correlation-based methods in both accuracy of specimen motion prediction from highly noisy TEM movies and computational efficiency of drift calculation from abundant image frames, which holds great promise for diverse applications in low-dose TEM imaging of beam-sensitive materials, such as metal-organic frameworks (MOFs) and covalent organic frameworks (COFs).
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