Abstract
A third-order aberration theory has been developed for the Offner imaging spectrometer comprising an extended source; two concave mirrors; a convex diffraction grating; and an image plane. Analytic formulas of the spot diagram are derived for tracing rays through the system based on Fermat’s principle. The proposed theory can be used to discuss in detail individual aberrations of the system such as coma, spherical aberration and astigmatism, and distortion together with the focal conditions. It has been critically evaluated as well in a comparison with exact ray tracing constructed using the commercial software ZEMAX. In regard to the analytic formulas, the results show a high degree of practicality.
Highlights
An imaging spectrometer can provide a simultaneous collection of spatial and spectral information of targets with high resolution [1]
Taking an extended source into consideration, analytic formulas of the spot diagram and the individual aberrations are derived for tracing rays through the system based on Fermat’s principle and Namioka’s theories
The results indicate a high degree of validity of the analytic formulas
Summary
An imaging spectrometer can provide a simultaneous collection of spatial and spectral information of targets with high resolution [1]. This spectrometer is obtained by replacing the convex secondary mirror of the Offner imaging system with a reflective convex diffraction grating [8] It provides a high signal-to-noise ratio and small spot sizes together with low spatial and spectral distortions [7,8,9,10,11]. Taking an extended source into consideration, analytic formulas of the spot diagram and the individual aberrations are derived for tracing rays through the system based on Fermat’s principle and Namioka’s theories With these formulas, aberrations including coma, aberration, astigmatism, and distortion of the three-concentric-element (Offner) configuration are discussed in detail together with focal conditions.
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