Genomic Analysis of Chromosomal Regions Introgressed from Tepary Bean Associated with CBB Resistance in Phaseolus. vulgaris L.

Abstract

One of the highest levels of common bacterial blight (CBB) resistance identified in Phaseolus vulgaris is found in XAN-159, which was developed for leaf resistance to CBB through six generations of pedigree selection of progenies derived from the interspecific cross [(`Pinto UI 114' × PI 319441) × P. acutifolius PI 319443] × `Masterpiece'. A RAPD genetic linkage map was previously constructed in a recombinant inbred population derived from the common bean cross PC-50 × XAN-159 for identification of genomic regions associated with bacterial disease resistance in XAN-159. To confirm that chromosomal regions associated with CBB resistance in XAN-159 were introgressed from tepary bean, we investigated the parentage of each genomic interval in XAN-159 by studying the genomic constitutions of the four different parents involved in the pedigree. The results indicate that all genomic regions associated with CBB resistance contain intervals derived exclusively from tepary bean. The uniqueness of marker polymorphisms associated with resistance to CBB in XAN-159 will allow the application of marker assisted selection for these resistance genes in most populations of common bean.