Abstract
Due to soil changes, high density planting, and the use of straw-returning methods, wheat common root rot (spot blotch), Fusarium crown rot (FCR), and sharp eyespot (sheath blight) have become severe threats to global wheat production. Only a few wheat genotypes show moderate resistance to these root and crown rot fungal diseases, and the genetic determinants of wheat resistance to these devastating diseases are poorly understood. This review summarizes recent results of genetic studies of wheat resistance to common root rot, Fusarium crown rot, and sharp eyespot. Wheat germplasm with relatively higher resistance are highlighted and genetic loci controlling the resistance to each disease are summarized.
Highlights
Long-term environmental changes have greatly affected crop diseases
Using 832 polymorphic Diversity Arrays Technology (DArT) markers, four quantitative trait loci (QTL) resistant to spot blotch were mapped to chromosomes 1A, 3B, 7B, and 7D after analysis of 566 spring wheat germplasm (Adhikari et al, 2012)
Since recent review papers have already summarized QTLs conferring Fusarium Head Blight (FHB) resistance and susceptibility in wheat in detail (Buerstmayr et al, 2020; Fabre et al, 2020), here we have mainly focused on studies reporting wheat resistance to Fusarium crown rot (FCR) induced by F. pseudograminearum and F. culmorum
Summary
Long-term environmental changes have greatly affected crop diseases. For example, the higher temperatures associated with global warming may increase the severity of many plant diseases (Cohen and Leach, 2020). Four QTLs controlling resistance of wheat cultivar “Yangmai 6” to B. sorokiniana were mapped to chromosomes 2AL, 2BS, 5BL, and 6DL (Kumar et al, 2009). Genome-wide association studies (GWAS) have been widely used to identify QTLs. Using 832 polymorphic Diversity Arrays Technology (DArT) markers, four QTLs resistant to spot blotch were mapped to chromosomes 1A, 3B, 7B, and 7D after analysis of 566 spring wheat germplasm (Adhikari et al, 2012).
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