Genetic mapping of quantitative trait loci (QTL) for resistance to septoria tritici blotch in a winter wheat cultivar Liwilla

Abstract

Septoria tritici blotch (STB), caused by Mycosphaerella graminicola (anamorph Septoria tritici, syn. Zymoseptoria tritici), is present in most wheat-growing areas worldwide. Resistance breeding appears to be the most sensible approach to disease control. An attempt was made to identify loci associated with resistance to STB in a resistant winter wheat cultivar Liwilla. In the study we used a set of 74 doubled-haploid lines generated from anthers of F1 hybrids between the resistant cultivar Liwilla and susceptible cultivar Begra. Four monopycnidiospore isolates of M. graminicola with diverse pathogenicity were used in tests on seedlings under controlled growth conditions and on adult plants under polytunnel conditions over a six year period. In both environments, the percentage leaf area covered by necrosis and covered by pycnidia were measured; time to heading and plant height were also recorded for the polytunnel experiments. Seven isolate-specific quantitative trait loci (QTLs) were associated with STB resistance: QStb.ihar-3A.2, QStb.ihar-6A, QStb.ihar-7A.2, QStb.ihar-1B, QStb.ihar-2B.2, QStb.ihar-3B, and QStb.ihar-5D. QTL on chromosome 5D and 7A represent novel STB resistance loci. The phenotypic variance explained by individual QTLs ranged from 9.5 % to 50.3 %. Three QTLs detected on chromosomes 3A, 7A and 1B showed major effects and were detected consistently in different environments. The locations of QStb.ihar-3A.2 and QStb.ihar-1B coincide with the resistance genes Stb6 and Stb11, respectively. Locus QStb.ihar-3B and a QTL for time to heading mapped to the same location, but are most likely not associated. Most of the mapped QTLs explain the resistance associated with both low necrosis and low pycnidia coverage.