Abstract

Increasing grain yield potential in wheat has been a major target of most breeding programs. Genetic advance has been frequently hindered by negative correlations among yield components that have been often observed in segregant populations and germplasm collections. A tetraploid wheat collection was evaluated in seven environments and genotyped with a 90K SNP assay to identify major and stable quantitative trait loci (QTL) for grain yield per spike (GYS), kernel number per spike (KNS) and thousand-kernel weight (TKW), and to analyse the genetic relationships between the yield components at QTL level. The genome-wide association analysis detected eight, eleven and ten QTL for KNS, TKW and GYS, respectively, significant in at least three environments or two environments and the mean across environments. Most of the QTL for TKW and KNS were found located in different marker intervals, indicating that they are genetically controlled independently by each other. Out of eight KNS QTL, three were associated to significant increases of GYS, while the increased grain number of five additional QTL was completely or partially compensated by decreases in grain weight, thus producing no or reduced effects on GYS. Similarly, four consistent and five suggestive TKW QTL resulted in visible increase of GYS, while seven additional QTL were associated to reduced effects in grain number and no effects on GYS. Our results showed that QTL analysis for detecting TKW or KNS alleles useful for improving grain yield potential should consider the pleiotropic effects of the QTL or the association to other QTLs.

Highlights

  • Increasing grain yield in cereal crops has been a major goal of most breeding programs, and the effects of genetic improvement on yield potential has been reported in several studies [1

  • The objectives of this study were: a) to identify major and stable quantitative trait loci (QTL) for kernel number per spike (KNS) and for thousand kernel weight (TKW) by genome-wide association study (GWAS) in a tetraploid wheat collection evaluated in several environments; b) to analyse the genetic relationships between grain yield per spike (GYS), KNS and TKW at QTL level; c) to identify molecular markers tightly linked to grain yield components

  • The tetraploid wheat (Triticum turgidum L., 2n = 4x = 28; AABB genome) collection used in this study was comprised of 233 accessions (S1 Table) chosen to represent the phenotypic variability for the grain yield component traits that were evaluated in this study

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Summary

Introduction

Increasing grain yield in cereal crops has been a major goal of most breeding programs, and the effects of genetic improvement on yield potential has been reported in several studies [1–. Relationships between grain yield components by genome-wide association mapping in wheat. Improving grain yield has always been a difficult task as it is a typical quantitative trait controlled by several genes, strongly influenced by environmental factors and crop management. In the last five decades, genetic gains in common and durum wheat have been mainly obtained by increasing harvest index associated to the gradual reduction in plant height. Further improvement are expected by increasing the biomass production and the radiation use efficiency without any reduction of the harvest index of modern cultivars [7,8,9,10]. Grain yield potential is the final product of plant growth and development, and several others complex factors, such as abiotic stress tolerance, adaptation to different soils and climate changes, disease resistances, contribute to plant productivity

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