Abstract

Yield and related traits controlled by multiple genes are the most important goal of wheat breeding. In this chapter, QTL mapping was used to detect yield and related traits, such as thousand-grain weight and spike-related traits (spike length, grain number per spike, spikelets per spike, fertile spikelets per spike, sterile spikelets per spike, compactness, and spike weight). The QTL results may facilitate yield improvement through molecular marker-assisted selection.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call