Genetic control of Russian wheat aphid (Diuraphis noxia) resistance in wheat accession PI 47545

Abstract

The Russian wheat aphid, Diuraphis noxia (Mordvilko), is a major pest of cereal crops in many areas of the world, causing serious reduction in grain yield in wheat (Triticum aestivum L.) and barley (Hordeum vulgare L.). Incorporating genetic resistance to D. noxia into wheat cultivars is paramount to effectively reduce damage inflicted by this pest. Genetic resistance to D. noxia has been identified in wheat, barley and rye germplasm, and several resistance genes are available for use for cultivar improvement. In the United States of America, only a few Russian wheat aphid (RWA) resistant winter wheat cultivars are currently available, and these cultivars contain only one of the six known RWA resistance genes. The objective of this study was to determine the inheritance of RWA resistance in wheat accession PI 47545, using a screening method based on differences in the leaf morphology of resistant and susceptible types following insect challenge. PI 47545 was selected for study, since it displayed high levels of resistance in a white-grained wheat background, the predominant wheat class produced in the Pacific Northwest of the USA. Segregation analysis was conducted on an F2 population developed by cross-hybridizing the susceptible soft white winter wheat cultivar ‘Daws’ to the resistant accession PI 47545. Russian wheat aphid screening data from this population indicated that the resistance in PI 47545 is controlled by a single, dominant gene (χ2 = 1.72; p ≤ 0.189).