Genetic Analysis Of Advanced Wheat (Triticum Aestivum L.) Lines Grown Under Different Sowing Conditions

Abstract

An investigation was made with 50 genotypes to study genetic variability and character association for yield and yield attributing traits under timely and late sown condition and screening of genotypes for spot blotch resistance. All the traits showed high heritability. Of the 12 yield components, only harvest index was correlated positively and significantly with grain yield/plant in both sowing conditions. In timely sown condition highest positive direct effect on Yield/plant was imposed by Days to 50% flowering (3.011) at genotypic level with residual effect R=0.02. In phenotypic path highest positive direct effect on Yield/plant was imposed by Days to 50% heading (0.426) with residual effect R=0.06. In late sown condition highest positive direct effect on Yield/plant was imposed by Days to 50% flowering (0.318) at genotypic level with residual effect R=0.02. In phenotypic path highest positive direct effect on Yield/plant was imposed by Harvest index (0.232) with residual effect R=0.02. MLR analysis revealed Days to 50% flowering in timely sown condition and Days to 50% heading in late sown condition to be most sensitive towards AUDPC in a negative direction. NEST 20-8 performed very well in both the conditions and was moderately resistant against spot blotch.