Abstract
AbstractLeaf pubescence density (PD) is an important component for the adaptation of soybean [Glycine max (L.) Merr.] to drought‐prone environment. Quantitative trait loci (QTL) controlling PD on the upper surface of leaf blade (PDU), PD on the lower surface of leaf blade (PDL), leaf wilting coefficient (WC) and rate of excised leaf drying (ELD) were identified using recombinant inbred lines (RILs) population from the cross between soybean cultivars ‘kefeng1’ and ‘nannong1138‐2’ at the field soil drought stress stage from the mid‐end of stem elongation to onset of flowering. A total of 20 QTLs were detected on molecular linkage groups (MLGs) A2, D1b, E, H, G and I with individual QTL explained 4.49–23.56% of phenotypic variation by composite interval mapping. The QTLs for PD on MLG H were mapped to near Ps locus while the QTLs on MLG D1b were located near Rsc‐7. Three genome regions for PD and water status traits on MLGs A2, D1b and H were associated. This study revealed that leaf surface PD may play an important role in the soybean drought tolerance.
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