Abstract

We study the sharp focusing of the input structured light field that has a non-uniform elliptical polarization: the parameters of the ellipse depend on the position in the input plane (we limited ourselves to the dependence only on the angular variable). Two types of non-uniformity were considered. The first type corresponds to the situation when the semi-axes of the polarization ellipse are fixed while the slope of the major semi-axis changes. The second type is determined by the situation when the slope of the major semi-axis of the polarization ellipse is constant, and the ratio between the semi-axis changes (we limited ourselves to the trigonometric dependence of this ratio on the polar angle). Theoretical and numerical calculations show that in the case of the first type of non-uniformity, if the tilt angle is a multiple of the polar angle with an integer coefficient, then the intensity distribution has rotational symmetry, and the energy flow is radially symmetric and has the negative direction near the optical axis. In this second case, the intensity symmetry is not very pronounced, but with an odd dependence of the ratio of the semi-axes of the polarization ellipse, the focused field at each point has a local linear polarization, despite the rather complex form of the input field. In addition, we investigate the distribution of the longitudinal component of the Poynting vector. The obtained results may be used for the formation of focused light fields with the desired distributions of polarization, Poynting vector density, or spin angular momentum density in the field of laser manipulation and laser matter interaction.

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