Abstract
The author presents a new strategy to select a minimal test pattern set as a basis for test pattern generation by specific software or hardware modules. In contrast to other proposals this procedure is totally independent of the used test pattern generation algorithm. Based on the basic deterministic test pattern set, the test generation hardware can be easily realized. It is possible to show that the storage requirements could be drastically reduced on an average of more than 80% compared with the original deterministic test pattern sets. >
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
