Generation of address sequences for effective random access memory testing

Abstract

In the present article the problem of efficient application of multiple march tests for the purpose of detecting faults in random access memory, realized through the generation of different address sequences, is considered. For these purposes, a new algorithm for generating address sequences is proposed and the efficiency gained from its application evaluated. In the conclusion experimental results on the use of the proposed method for generating address sequences are presented and the efficiency of the method in multiple run random access memory tests is demonstrated.