Abstract
Generating valid test data through data cloning
Full Text
Sign-in/Register to access full text options
Published version (Free)
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
https://doi.org/10.1016/j.future.2023.02.020
Copy DOIJournal: Future Generation Computer Systems | Publication Date: Jul 1, 2023 |
License type: cc-by |
Generating valid test data through data cloning
Join us for a 30 min session where you can share your feedback and ask us any queries you have