Abstract
Generalized spectroscopic ellipsometry (g-SE) and Mueller-matrix (MM) measurements are applied to twisted nematic (TN) and super twisted nematic (STN) displays. Transmitted measurements near normal incidence are used to extract twist, φ( d), and anisotropy for each display type. Angle-dependent measurements are used to determine tilt distribution, θ( d). Oblique angle measurements allow characterization of both ordinary and extraordinary indices. Finally, the liquid crystal layer thickness is accurately determined from coherent interference oscillations.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
