Generalized oscillator strengths for the valence-shell excitations of xenon studied by the high-resolution fast-electron impact

Abstract

SynopsisUsing the high-resolution fast-electron energy loss spectrometer, the generalized oscillator strengths (GOSs) of the valence-shell excitations of xenon were determined at a high resolution of 70 meV and a high incident electron energy of 1500 eV, and the momentum transfer dependence behaviors of GOSs of the 6s[3/2]1 and 6s'[1/2]1 excitations of xenon are discussed.