Abstract
Generalized-barrier parameters are studied theoretically for rectangular and trapezoidal single-barriers as well as parallel-plane ones, which are basic units for double-barrier and multiple-barrier structures. Analytical expressions for these parameters are derived by taking into account the position-dependent effective-mass effect. Furthermore, the expressions for the generalized-barrier parameters of optical single-layer thin film structures are considered and permit direct application of previous results to thin film interference filters also. The heights of resonant peaks and the resonance widths in asymmetrical double-barrier structures are studied as functions of the generalized-barrier parameters.
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