Abstract
GENEFPis a full-profile fitting program, employing a fundamental-parameters method, for Cu-target X-ray powder patterns. In this program, the Le Bail method is used to determine integrated intensities and the genetic algorithm is used to search for the proper fundamental parameters. When some parameters, such as the grain size, have large uncertainties, the genetic algorithm has an advantage over conventional least-squares methods in finding the global extremum.
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