Abstract
The existing structures of embryonics cell's genome memory were analyzed,and a reliability model was developed considering the effect of the gene backup number on self-repair process. The hardware overhead model was built depending on the implementations of genome memories. Based on the reliability model and hardware overhead model,the relationship among reliability,hardware overhead and gene backup number was analyzed,and a gene backup number selection method was proposed. The genome memory structure,gene backup number and the size of embryonics array,taking into account the system reliability and hardware overhead,can be selected with the proposed method,according to the design requirement of reliability and hardware overhead of target circuit. So the proposed method can be introduced to the engineering application. At last,the method is verified through a circuit's gene backup number selection.
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More From: Journal of Beijing University of Aeronautics and Astronautics
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