Abstract

Six parent diallel cross without reciprocal was studied to investigate the genetic behavior of different agronomic traits in rice. The analysis of Wr-Vr graph showed that panicle length, thousand grain weight and grain yield per plant did not follow the additive-dominance model indicating epistatic gene action responsible for the expression of these traits. All other traits under the study were conditioned by overdominance gene action except grains per panicle, which was controlled by partial dominance. The Yr? – (Vr + Wr)? graph revealed random distribution of dominant and recessive gene in expressing different traits in different parent, while correlation between parental mean and parental order of dominance indicated increasing effect of dominant gene for all the traits except days to heading and % spikelet sterility.DOI: http://dx.doi.org/10.3329/bjpbg.v20i2.17033

Highlights

  • Since the green revolution of 1960s semi-dwarf rice varieties are mostly cultivated elsewhere in the world and the yield of such varieties has arrived at plateau

  • An attempt has been undertaken to investigate the genetic behavior of different agronomic traits in rice

  • Thousand grain weight and yield per plant did not satisfy the simple additive-dominance model even after excluding one or more array(s). This indicated that thousand grain weight and grain yield per plant might be conditioned by epistatic gene action

Read more

Summary

Introduction

Since the green revolution of 1960s semi-dwarf rice varieties are mostly cultivated elsewhere in the world and the yield of such varieties has arrived at plateau. The analysis of all arrays for Wr-Vr graph showed that regression coefficients did not differ significantly from unity except days to heading and panicles per plant. Elimination of array 1 for P1 gave a regression coefficient, b=0.811 0.243 (Fig.1a), which was significantly different from zero but not from unity, suggested additive genetic system and the parent P1 contained the epistatic genes.

Results
Conclusion
Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call