Abstract
We present spherical analysis of electron backscatter diffraction (EBSD) patterns with two new algorithms: (1) band localisation and band profile analysis using the spherical Radon transform; (2) orientation determination using spherical cross correlation. These new approaches are formally introduced and their accuracies are determined using dynamically simulated patterns. We demonstrate their utility with an experimental dataset obtained from ferritic iron. Our results indicate that the analysis of EBSD patterns on the surface of the sphere provides an elegant method of revealing information from these rich sources of crystallographic data.
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