Abstract
Gaussian beams have been obtained from a GaAs junction laser operating in conjunction with a microscope objective and a slit. The laser mirror illumination, as viewed in the image plane of the objective, is asymmetric perpendicular to the junction plane and consists of a primary intensity maximum along with several weaker secondary peaks. The slit, placed in the image plane, suppresses the secondary peaks thereby eliminating their effects in the diffraction field. The isolated primary maximum is approximately Gaussian shaped and the radiation emanating from the slit retains its Gaussian profile as it propagates into the far-field region.
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