Abstract
We report on the application of the gate-modulation (GM) imaging technique in rapid and collective inspection of organic thin-film transistor (OTFT) array operations. The method allows visualizing charge carriers accumulated in the OTFT array by time-translational differential image sensing with the use of a charge coupled device (CCD) sensor. The feature makes it possible to visualize the dead pixels, broken channels, or distributed device performance in the OTFT array. We discuss how to correlate the spectroscopic information of GM signal with the device performance and how to use this technique in the collective inspection of OTFT arrays.
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