Abstract

The paper deals with automated generation of diagnostic test sequences for synchronous sequential circuits. An algorithm is proposed, named GARDA, which is suitable to produce good results with acceptable CPU time and memory requirements even for the largest benchmark circuits. The algorithm is based on Genetic Algorithms, and experimental results are provided which demonstrate the effectiveness of the approach. >

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call