Abstract

Glass-based materials are one of the most common shielding materials. Phosphate glasses have unique properties that make them useful for some technical and industrial applications. The mass attenuation coefficients (μm), effective atomic cross sections (σa), effective atomic numbers and electron densities (Zeff and Neff) of phosphate glasses containing different concentrations of Bi2O3, PbO, and BaO (30–70% by weight) have been determined in the energy range of 10 keV–10 MeV. To calculate these parameters, XCOM and XMuDat computer programs and also the Auto-Zeff software and interpolation method have been used. The results of XCOM, XMuDat and Auto-Zeff programs were in good agreement. It was found that the μm and σa parameters decrease as the photon energy increase. Also, the σa and Zeff values improve by increasing the Bi2O3, PbO and BaO contents, while increasing these contents to the same fraction has no significant effect on μm in the energy range of 0.4–4 MeV, where the Compton Effect takes over as dominant process. Furthermore, the Neff is approximately independent of metal oxides concentrations. Wherever possible, the calculated values were compared with the experimental data.

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