Abstract
Positron annihilation technique was used to reveal the evolution of small pore structure of semi-crystalline ultra high molecular weight poly(ethylene oxide) under γ-irradiation. It has been established that the structure of poly(ethylene oxide) is improved under low dose irradiation (<20 kGy), while the concentration of free-volume holes in amorphous regions increases at higher doses. The results were compared with those from small angle X-ray scattering and wide angle X-ray scattering measurements of the same samples.
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