Abstract

A galvanic cell technique was developed to measure the ionic and electronic transference numbers of metal oxides at high temperatures. The cell uses stabilized zirconia probes in addition to the conventional metal probes. With both types of probes, measurements of the transference numbers for electronic, ionic, or mixed conductors are possible and surface polarization effects are readily detected. Measurements of yttria‐doped ceria and urania demonstrate the advantages of the technique over the available methods.

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