Gain dynamics of ionic excimer (XeCs)+ emission at 160 nm in Ar/Xe/Cs mixtures

Abstract

Gain and absorption of the ionic excimer (XeCs)+ emission at 160 nm in Ar/Xe/Cs mixtures were studied by kinetic model calculations. Both the e-beam and the self-sustained discharge excitation schemes were investigated. Model results indicate that when pumped by 20 ns, 1 MeV e-beam, the mixtures exhibit only loss as absorption due to atomic Cs dominates. Under discharge pumping, 99.9% of the atomic Cs is ionized. Positive net gain up to 2%/cm in the ternary discharge plasma is predicted by model calculations.