Abstract
Thin GaAs films were heteroepitaxially grown on Si substrates by mixture beams of 60 eV ions and neutral molecules without prebaking at a high temperature or intermediate layers. Surfaces of the Si substrates were amorphized by collision of the low-energy ions. The amorphous Si surface layers were automatically inserted between Si substrates and GaAs films and they served as a buffer layer to relieve strain due to large lattice mismatch and difference in coefficients of linear expansion between GaAs films and Si substrates.
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