G. Schmahl, D. Rudolph: X‐ray microscopy. Proceedings of the international symposium Göttingen, Fed. Rep. of Germany, September 14.–16. 1983. Springer Series in Optical Sciences, Vol. 43. 343 p., 262 fig. Price: Cloth DM 68.—, Springer‐Verlag Berlin, Heidelberg, New York‐Tokyo 1984.ISBN 3‐540‐13271‐6

Abstract

Crystal Research and TechnologyVolume 20, Issue 4 p. 587-587 Book Review G. Schmahl, D. Rudolph: X-ray microscopy. Proceedings of the international symposium Göttingen, Fed. Rep. of Germany, September 14.–16. 1983. Springer Series in Optical Sciences, Vol. 43. 343 p., 262 fig. Price: Cloth DM 68.—, Springer-Verlag Berlin, Heidelberg, New York-Tokyo 1984.ISBN 3-540-13271-6 O. Brümmer, O. BrümmerSearch for more papers by this author O. Brümmer, O. BrümmerSearch for more papers by this author First published: April 1985 https://doi.org/10.1002/crat.2170200434AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat No abstract is available for this article. Volume20, Issue4April 1985Pages 587-587 RelatedInformation