Abstract
In this work, an improved phase stitching algorithm is proposed in digital holography (DH) based on a deduced phase errors model and a global optimization algorithm. In addition, to correct the relative rotation error between the coordinate systems of a CCD and xy-motion stages, we presented a simple and reliable image-based correction method. The experimental results obtained from our proposed method are compared with those calculated from the existing phase stitching method to verify the performance of the presented method. It is shown that our new proposed methods are robust and valid for measurement of a large microstructure element. As far as we know, the improved phase stitching algorithm and image-base correction method have not been discussed in DH, as we presented in this paper.
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